dc.contributor.author | Wanjii, S | |
dc.date.accessioned | 2015-01-26T07:54:25Z | |
dc.date.available | 2015-01-26T07:54:25Z | |
dc.date.issued | 2013-06-01 | |
dc.identifier.other | TMEE3831 | |
dc.identifier.uri | http://hdl.handle.net/11070.1/8112 | |
dc.language.iso | en | en_US |
dc.relation.ispartofseries | Normal examination; | |
dc.subject | Engineering | en_US |
dc.subject | Information technology | en_US |
dc.subject | Mechanical & Industrial engineering | en_US |
dc.subject | Thermal machines | en_US |
dc.title | Thermal machines | en_US |
dc.type | Other | en_US |